納米技術與精密工程
- A twist sensor based on polarization-maintaining fibers with different cladding diameters
- Interfacial stress characterization of GaN epitaxial layer with sapphire substrate by confocal Raman spectroscopy
- Environmental temperature effect on dimensional measurements of atomic force microscopy
- Cutting performance of micro-textured PCBN tool
- Review of flexible microelectromechanical system sensors and devices